GdFe2 alloy formation studied on the atomic scale by scanning tunneling microscopy

R. Pascal, M. Getzlaff, H. Tödter, M. Bode, and R. Wiesendanger
Phys. Rev. B 60, 16109 – Published 15 December 1999
PDFExport Citation

Abstract

Well-ordered GdFe2 alloy films of up to two ML thickness were grown on top of a W(110) substrate and characterized by using scanning tunneling microscopy/spectroscopy (STM/STS) and low-energy electron diffraction (LEED). The crystallographic structure of the ultrathin films was found to be different from the well-known bulk structure (C15 Laves phase). This is supposed to result from the influence of the substrate on the growth behavior. Based on atomically resolved STM images and LEED studies, a structure model for the ultrathin GdFe2 films on W(110) is proposed.

  • Received 12 May 1999

DOI:https://doi.org/10.1103/PhysRevB.60.16109

©1999 American Physical Society

Authors & Affiliations

R. Pascal, M. Getzlaff*, H. Tödter, M. Bode, and R. Wiesendanger

  • Institute of Applied Physics and Microstructure Research Center, University of Hamburg, Jungiusstrasse 11, D-20355 Hamburg, Germany

  • *Author to whom correspondence should be addressed. FAX: (+49)40428385311. Electronic address: getzlaff@physnet.uni-hamburg.de

References (Subscription Required)

Click to Expand
Issue

Vol. 60, Iss. 23 — 15 December 1999

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×