Abstract
We confirm a recently proposed scaling relation for the nonlinear ac susceptibility response of type-II superconductors by high-precision measurements on a c-axis oriented thin film. From measurements in different ac field and frequency combinations, given by the scaling relation, the flux creep exponent of the superconducting film can be determined. At and in the field range studied, is found to vary with the dc bias field as
- Received 16 February 1999
DOI:https://doi.org/10.1103/PhysRevB.60.14913
©1999 American Physical Society