Scanned potential microscopy of edge and bulk currents in the quantum Hall regime

Kent L. McCormick, Michael T. Woodside, Mike Huang, Mingshaw Wu, Paul L. McEuen, Cem Duruoz, and J. S. Harris, , Jr.
Phys. Rev. B 59, 4654 – Published 15 February 1999
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Abstract

Using an atomic force microscope as a local voltmeter, we measure the Hall voltage profile in a two-dimensional electron gas in the quantum Hall (QH) regime. We observe a linear profile in the bulk of the sample in the transition regions between QH plateaus and a distinctly nonlinear profile on the plateaus. In addition, localized voltage drops are observed at the sample edges in the transition regions. We interpret these results in terms of theories of edge and bulk current in the QH regime.

  • Received 2 September 1998

DOI:https://doi.org/10.1103/PhysRevB.59.4654

©1999 American Physical Society

Authors & Affiliations

Kent L. McCormick, Michael T. Woodside, Mike Huang, Mingshaw Wu, and Paul L. McEuen

  • Department of Physics, University of California, Berkeley, California 94720
  • Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720

Cem Duruoz and J. S. Harris, , Jr.

  • Department of Electrical Engineering, Stanford University, Stanford, California 94309

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Vol. 59, Iss. 7 — 15 February 1999

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