Abstract
The variation of the normal-mode coupling in a semiconductor microcavity is demonstrated by reducing the cavity quality through stepwise removing top mirror pairs. The dependence of the measured normal-mode coupling linewidths on the cavity quality is well reproduced by calculations on the basis of a linear dispersion theory with broadened excitons in a microcavity.
- Received 15 January 1999
DOI:https://doi.org/10.1103/PhysRevB.59.13525
©1999 American Physical Society
