Direct observation of localized dipolar excitations on rough nanostructured surfaces

Sergey I. Bozhevolnyi, Vadim A. Markel, Victor Coello, W. Kim, and Vladimir M. Shalaev
Phys. Rev. B 58, 11441 – Published 1 November 1998
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Abstract

Using a photon scanning tunneling microscope (operating alternatively at the wavelengths of 594 and 633 nm) with shear-force feedback we image the topography of silver colloid fractals simultaneously with a near-field intensity distribution. We observe that near-field optical images exhibit spatially localized (within 150–250 nm) intensity enhancement by one to two orders of magnitude. These bright light spots are found to be sensitive to the light wavelength, polarization, and angle of incidence. We relate the observed phenomenon to the localization of resonant dipolar excitations in random nanostructured aggregates.

  • Received 20 January 1998

DOI:https://doi.org/10.1103/PhysRevB.58.11441

©1998 American Physical Society

Authors & Affiliations

Sergey I. Bozhevolnyi

  • Mikroelektronik Centret, Technical University of Denmark, Building 345 East, DK-2800 Lyngby, Denmark

Vadim A. Markel*

  • Department of Physics, New Mexico State University, Las Cruces, New Mexico 88003

Victor Coello

  • Institute of Physics, Aalborg University, Pontoppidanstrde 103, DK-9220 Aalborg, Denmark

W. Kim and Vladimir M. Shalaev

  • Department of Physics, New Mexico State University, Las Cruces, New Mexico 88003

  • *Also with the Institute of Automation and Electrometry, Siberian Branch of RAS, 630090 Novosibirsk, Russia.
  • Author to whom correspondence should be addressed. Electronic address: vshalaev@nmsu.edu.

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Vol. 58, Iss. 17 — 1 November 1998

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