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Perpendicular magnetization in ultrathin electrodeposited cobalt films

J. L. Bubendorff, E. Beaurepaire, C. Mény, P. Panissod, and J. P. Bucher
Phys. Rev. B 56, R7120(R) – Published 15 September 1997
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Abstract

Electrodeposited ultrathin cobalt films on Au(111) covered with a protective copper film can show perpendicular magnetization exactly like their ultrahigh-vacuum-grown counterparts. At high deposition rates of cobalt, out-of-plane magnetization is stabilized in the thickness range from 2 to 8 atomic layers while low deposition rates favor in-plane magnetization at any thickness. The cobalt films possess hcp structure with the c axis perpendicular to the Au(111) plane. The technique is versatile and leads to quality standards comparable to those obtained by molecular-beam epitaxy, but at a much lower cost.

  • Received 5 May 1997

DOI:https://doi.org/10.1103/PhysRevB.56.R7120

©1997 American Physical Society

Authors & Affiliations

J. L. Bubendorff, E. Beaurepaire, C. Mény, P. Panissod, and J. P. Bucher

  • Institut de Physique et de Chimie des Matériaux de Strasbourg (IPCMS), Université Louis Pasteur, 23 rue du Loess, F-67037 Strasbourg Cedex, France

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Vol. 56, Iss. 12 — 15 September 1997

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