Magnetic properties of thin Ni films measured by a dc SQUID-based magnetic microscope

O. V. Snigirev, K. E. Andreev, A. M. Tishin, S. A. Gudoshnikov, and J. Bohr
Phys. Rev. B 55, 14429 – Published 1 June 1997
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Abstract

We have applied a scanning HTS (high-temperature superconductor) dc SQUID (superconducting quantum interference device) -based magnetic microscope to study the magnetic properties of Au/Ni/Si(100) films in the thickness range from 8 to 200 Å at T=77 K. A one-domain structure with in-plane orientation of the magnetic moment was found for film thicknesses exceeding 26 Å. A drastic decrease of the magnetization of the film was detected when the thickness is less than 26 Å.

  • Received 21 October 1996

DOI:https://doi.org/10.1103/PhysRevB.55.14429

©1997 American Physical Society

Authors & Affiliations

O. V. Snigirev, K. E. Andreev, and A. M. Tishin

  • Faculty of Physics, M.V. Lomonosov Moscow State University, Moscow, 119899, Russia

S. A. Gudoshnikov

  • Institute of Terrestrial Magnetism, Ionosphere and Radio Wave Propagation, Russian Academy of Sciences, 142092, Moscow region, Troitsk, Russia

J. Bohr

  • Department of Physics, Technical University of Denmark, Building 307, DK-2800 Lyngby, Denmark

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Vol. 55, Iss. 21 — 1 June 1997

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