Carrier-carrier scattering in the gain dynamics of InxGa1xAs/AlyGa1yAs diode lasers

G. D. Sanders, C.-K. Sun, B. Golubovic, J. G. Fujimoto, and C. J. Stanton
Phys. Rev. B 54, 8005 – Published 15 September 1996
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Abstract

Ultrafast optical nonlinearities in semiconductors play a central role in determining transient amplification and pulse-dependent gain saturation in diode lasers. Both carrier-phonon and carrier-carrier scattering are expected to determine the gain dynamics in these systems. We present a relaxation-time approximation model for carrier-carrier scattering in strained-layer lasers. The carrier-carrier scattering rates are determined using the quasiequilibrium distribution functions for a given background carrier density. The distribution function to which the photoexcited distribution relaxes is a Fermi-Dirac function where the chemical potential and temperature are self-consistently chosen so that both particle number and energy are conserved in the carrier-carrier scattering process. The relaxation approximation makes the problem an effective one-dimensional problem which can then be solved directly for the carrier distributions using an adaptive Runge-Kutta routine. This procedure is less computationally intensive than a full Monte Carlo simulation. The results show that the inclusion of carrier-carrier scattering improves previous results where only carrier-phonon scattering was included and that carrier-carrier scattering is necessary to produce heating of the carriers in the high-energy tails. © 1996 The American Physical Society.

  • Received 10 October 1995

DOI:https://doi.org/10.1103/PhysRevB.54.8005

©1996 American Physical Society

Authors & Affiliations

G. D. Sanders

  • Mikroelektronik Centret, Danmarks Tekniske Universitet, DK-2800 Lyngby, Denmark

C.-K. Sun

  • Department of Electrical and Computer Engineering, University of California at Santa Barbara, Santa Barbara, California 93106
  • Department of Electrical Engineering and Computer Science, Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

B. Golubovic and J. G. Fujimoto

  • Department of Electrical Engineering and Computer Science, Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

C. J. Stanton

  • Mikroelektronik Centret, Danmarks Tekniske Universitet, DK-2800 Lyngby, Denmark

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Vol. 54, Iss. 11 — 15 September 1996

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