X-ray absorption at the L2,3 edge of an anisotropic single crystal: Cadmium (0001)

P. Le Fèvre, H. Magnan, and D. Chandesris
Phys. Rev. B 54, 2830 – Published 15 July 1996
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Abstract

Surface extended x-ray-absorption fine structure (EXAFS) is a very powerful technique for the crystallographic characterization of adsorbed atoms, layers, and thin films. The linear polarization of the synchrotron radiation is used to infer direct information about the crystallographic anisotropy of these systems. For the K absorption edge, the polarization dependence of the EXAFS signal is simple: the contribution of each bond is weighted by a factor cos2θ, where θ is the angle between the direction of the bond and the linear polarization of the x rays. For L2,3 absorption edges, the polarization dependence is more complicated, since the initial p state can be excited to a final state of s or d symmetry. The angular dependences of these two terms are strongly different. We show here, with a study on a bulk anisotropic system, cadmium, that the two terms have to be considered and that neglecting the p to s transitions in the analysis of angular-dependent spectra leads to errors in bond-length determination as high as 0.1 Å. © 1996 The American Physical Society.

  • Received 15 January 1996

DOI:https://doi.org/10.1103/PhysRevB.54.2830

©1996 American Physical Society

Authors & Affiliations

P. Le Fèvre

  • Laboratoire pour l'Utilisation du Rayonnement Electromagnetique (LURE), Université Paris Sud, 91405 Orsay Cedex France
  • Service de Recherche sur les Surfaces et l'Irradiation de la Matiere, Commissariate a`l'Energie Atomique Saclay, 91191 Gif sur Yvette, France

H. Magnan

  • Laboratoire pour l'Utilisation du Rayonnement Electromagnetique (LURE), Université Paris Sud, 91405 Orsay Cedex France
  • Service de Recherche sur les Surfaces et l'Irradiation de la Matiere, Commissariate a`l'Energie Atomique Saclay, 91191 Gif sur Yvette, France

D. Chandesris

  • Laboratoire pour l'Utilisation du Rayonnement Electromagnetique (LURE), Université Paris Sud, 91405 Orsay Cedex France

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Vol. 54, Iss. 4 — 15 July 1996

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