Spin scattering in ferromagnetic thin films

M. Viret, D. Vignoles, D. Cole, J. M. D. Coey, W. Allen, D. S. Daniel, and J. F. Gregg
Phys. Rev. B 53, 8464 – Published 1 April 1996
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Abstract

By combining parallel and transverse magnetoresistance measurements on thin films of Co and Ni, the contribution of spin scattering at the domain walls is separated from the anisotropic magnetoresistance (AMR). A model, based on the Larmor-precession-induced deviation of the conduction electron spin direction during domain-wall traversal is developed. By using a scattering probability which varies with the cosine of the angle between the carrier spin and the local exchange field (as used for giant magnetoresistance systems) it is possible to account for the amplitude of the measured magnetoresistive effect. © 1996 The American Physical Society.

  • Received 7 June 1995

DOI:https://doi.org/10.1103/PhysRevB.53.8464

©1996 American Physical Society

Authors & Affiliations

M. Viret, D. Vignoles, D. Cole, and J. M. D. Coey

  • Department of Physics, Trinity College, Dublin 2, Ireland

W. Allen, D. S. Daniel, and J. F. Gregg

  • Clarendon Laboratory, Parks Road, Oxford, OX1 3PU, United Kingdom

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Issue

Vol. 53, Iss. 13 — 1 April 1996

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