Multiple-scattering calculations of x-ray-absorption spectra

S. I. Zabinsky, J. J. Rehr, A. Ankudinov, R. C. Albers, and M. J. Eller
Phys. Rev. B 52, 2995 – Published 15 July 1995
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Abstract

A high-order multiple-scattering (MS) approach to the calculation of polarized x-ray-absorption spectra, which includes both x-ray-absorption fine structure and x-ray-absorption near-edge structure, is presented. Efficient calculations in arbitrary systems are carried out by using a curved-wave MS path formalism that ignores negligible paths, and has an energy-dependent self-energy and MS Debye-Waller factors. Embedded-atom background absorption calculations on an absolute energy scale are included. The theory is illustrated for metallic Cu, Cd, and Pt. For these cases the MS expansion is found to converge to within typical experimental accuracy, both to experiment and to full MS theories (e.g., band structure), by using only a few dozen important paths, which are primarily single-scattering, focusing, linear, and triangular.

  • Received 31 October 1994

DOI:https://doi.org/10.1103/PhysRevB.52.2995

©1995 American Physical Society

Authors & Affiliations

S. I. Zabinsky, J. J. Rehr, and A. Ankudinov

  • Department of Physics, University of Washington, Seattle, Washington 98195

R. C. Albers

  • Theoretical Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545

M. J. Eller

  • Microsoft Corporation, Redmond, Washington 98052

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Vol. 52, Iss. 4 — 15 July 1995

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