Theoretical possibility of stage corrugation in Si and Ge analogs of graphite

Kyozaburo Takeda and Kenji Shiraishi
Phys. Rev. B 50, 14916 – Published 15 November 1994
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Abstract

The planarity of the aromatic stage of two-dimensional Si and Ge layers are theoretically investigated by first-principles total-energy calculations. While a C atom prefers to form the flat aromatic stage, i.e., graphite, Si and Ge prefer to form the corrugated aromatic stage. Si can be said to be the critical element by which the corrugated stage is formed.

  • Received 12 July 1994

DOI:https://doi.org/10.1103/PhysRevB.50.14916

©1994 American Physical Society

Authors & Affiliations

Kyozaburo Takeda and Kenji Shiraishi

  • NTT Basic Research Laboratories, Atsugi, Kanagawa 243-01, Japan

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Issue

Vol. 50, Iss. 20 — 15 November 1994

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