Abstract
The sample-to-sample fluctuations in the shot-noise power of a quasi-one-dimensional, phase-coherent, metallic, diffusive conductor are studied by extending the random-matrix theory of universal conductance fluctuations. The variance of the shot-noise power is shown to be independent of the sample size and the degree of disorder. The precise numerical value is calculated. Furthermore, a weak-localization effect in the average shot-noise power is found. The effect of inelastic scattering for conductors longer than the phase-coherence length is discussed.
- Received 24 July 1992
DOI:https://doi.org/10.1103/PhysRevB.46.13400
©1992 American Physical Society