Abstract
The local structure of Fe/Cu multilayers prepared by sputtering is studied by x-ray absorption spectroscopy (XAS). We find that thin Cu layers grow with the bcc structure imposed by the Fe layers. For larger thicknesses, the Cu films are more disordered and beyond 13 Å the films relax to fcc structure. The thickness dependence of the magnetoresistance of the multilayers is discussed in the light of the XAS results.
- Received 13 April 1992
DOI:https://doi.org/10.1103/PhysRevB.46.1253
©1992 American Physical Society
