Temperature dependence of the c-axis resistivity of high-Tc layered oxides

N. Kumar and A. M. Jayannavar
Phys. Rev. B 45, 5001 – Published 1 March 1992
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Abstract

Electrical transport along the c axis of high-Tc layered oxides is pictured as a coherent interplanar tunneling between neighboring layers blocked by repeated intraplanar incoherent scatterings. This gives the same temperature dependence for the c-axis resistivity as that for the in-plane resistivity. Additional temperature dependence can arise from the temperature-dependent renormalization of the tunneling matrix element by an ohmic coupling to adiabatic phonons because of the large effective electron mass along the c axis. Our calculation is consistent with recent experimental results on single crystals, and makes some definite predictions that can be put to test.

  • Received 19 August 1991

DOI:https://doi.org/10.1103/PhysRevB.45.5001

©1992 American Physical Society

Authors & Affiliations

N. Kumar

  • Department of Physics and Jawaharlal Nehru Centre for Advanced Scientific Research, Indian Institute of Science, Bangalore 560 012, India

A. M. Jayannavar

  • Department of Physics, Indian Institute of Science, Bangalore 560 012, India

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Vol. 45, Iss. 9 — 1 March 1992

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