Abstract
The resistivity of thin single-crystalline Au and Ag layers is measured during deposition onto Si(111) surfaces at 95 K from zero to several tens of monolayers and for layers from 1.5 to 12 monolayers as a function of temperature. The structure of the layers is monitored by reflection high-energy electron diffraction (RHEED). In Au layers resistance oscillations occur synchronously with RHEED intensity oscillations. They are attributed to periodic variations of the specularity factor. Below 6 monolayers a three- to two-dimensional crossover is observed.
- Received 18 December 1987
DOI:https://doi.org/10.1103/PhysRevB.37.8622
©1988 American Physical Society
