Abstract
Effective mean free paths of hot electrons in the energy range 0.5 eV≤ eV are determined experimentally for the paraffin n- with the internal photoemission for transport analysis method. The hot-electron transport parameters are discussed in terms of fundamental scattering mechanisms in organic dielectrics. The influence of hot-electron-induced trap formation on the transport properties is investigated. The consequences for dielectric breakdown are pointed out.
- Received 13 June 1986
DOI:https://doi.org/10.1103/PhysRevB.34.8822
©1986 American Physical Society