Transport and relaxation of hot conduction electrons in an organic dielectric

E. Cartier and P. Pfluger
Phys. Rev. B 34, 8822 – Published 15 December 1986
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Abstract

Effective mean free paths of hot electrons in the energy range 0.5 eV≤Ekin20 eV are determined experimentally for the paraffin n-C36H74 with the internal photoemission for transport analysis method. The hot-electron transport parameters are discussed in terms of fundamental scattering mechanisms in organic dielectrics. The influence of hot-electron-induced trap formation on the transport properties is investigated. The consequences for dielectric breakdown are pointed out.

  • Received 13 June 1986

DOI:https://doi.org/10.1103/PhysRevB.34.8822

©1986 American Physical Society

Authors & Affiliations

E. Cartier and P. Pfluger

  • Brown Boveri Research Center, CH-5405 Baden, Switzerland

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Vol. 34, Iss. 12 — 15 December 1986

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