Abstract
The real and imaginary parts of the ordinary and extraordinary dielectric functions of CdSe have been investigated with a scanning rotating analyzer ellipsometer. Strong edge excitons and structure in the 4–5-eV region are observed. With the use of the second derivative versus frequency of these dielectric functions, a critical-point analysis of the observed structures and their temperature dependences has been performed. The obtained results are analyzed in terms of real and imaginary self-energies due to the electron-phonon interaction.
- Received 14 March 1986
DOI:https://doi.org/10.1103/PhysRevB.34.2458
©1986 American Physical Society