Electronic structure and properties of Ni-Si(001) and Ni-Si(111) reactive interfaces

O. Bisi, L. W. Chiao, and K. N. Tu
Phys. Rev. B 30, 4664 – Published 15 October 1984
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Abstract

A theoretical investigation of the Ni-Si(001) and Ni-Si(111) reactive interfaces using electronic band-structure calculation is presented. The following near-surface structures and interface models have been studied: (a) metastable adamantane structures of Ni interstitials in bulk Si at different stoichiometries: (b) isolated Ni interstitials near Si(001) and Si(111) surfaces; (c) single layer of NiSi2 rotated by 180° on Si(111); and (d) Ni atom chemisorbed on a single layer of NiSi2 on Si(111). The electronic properties of these structures and models are described and compared with the available experimental data. The low-Ni-coverage experimental results obtained for the (001) Si surface are interpreted in terms of an interfacial phase containing Ni interstitials in an adamantane geometry. For the (111) Si surface the experimental data provide evidence of both an interfacial phase containing Ni interstitials in an adamantane geometry and an epitaxial NiSi2-Si(111) interface.

  • Received 12 December 1983

DOI:https://doi.org/10.1103/PhysRevB.30.4664

©1984 American Physical Society

Authors & Affiliations

O. Bisi*, L. W. Chiao, and K. N. Tu

  • IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598

  • *Permanent address: Institute of Physics, University of Modena, I-41100 Modena, Italy.
  • Permanent address: Department of Physics, Georgetown University, Washington, D.C. 20057.

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Vol. 30, Iss. 8 — 15 October 1984

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