Abstract
The intrinsic linewidth in angle- and energy-resolved photoemission is generally assumed to be limited by the final-state lifetime. High-resolution measurements of the intrinsic linewidths for emission from bulk and surface states of Cu show that in some cases the linewidth is dominated by weakened conservation. We tentatively attribute this effect to a finite mean free path for elastic scattering from the small number (≈ 0.01 monolayer) of impurities present at the surface. This suggests that as instrumental precision improves, sample preparation may be the limiting factor determining resolution.
- Received 14 April 1983
DOI:https://doi.org/10.1103/PhysRevB.28.4267
©1983 American Physical Society