Data analysis in extended x-ray-absorption fine structure: Determination of the background absorption and the threshold energy

John J. Boland, Folim G. Halaka, and John D. Baldeschwieler
Phys. Rev. B 28, 2921 – Published 15 September 1983
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Abstract

Two approaches for the determination of the background absorption (μ0) in the extended x-ray-absorption fine structure (EXAFS) are presented. Both methods, experimental and computational, take advantage of the damping of the EXAFS amplitude resulting from the convolution with Gaussian functions of different widths. In the experimental method two or more spectra are collected with the use of different spectrometer slit widths, resulting in spectra of different resolutions for the same sample. In the computational approach the convolution is accomplished via a convolution algorithm. The intersection points of the resulting spectra are used to generate μ0. At the absorption edge, the spectra intersect at a unique point, which is shown to be a measure of the threshold energy, E0. Illustration of the two methods for background removal is given for a copper-foil sample. The computational approach is superior to the experimental method of damping the EXAFS spectra to give μ0.

  • Received 16 February 1983

DOI:https://doi.org/10.1103/PhysRevB.28.2921

©1983 American Physical Society

Authors & Affiliations

John J. Boland, Folim G. Halaka, and John D. Baldeschwieler

  • Division of Chemistry and Chemical Engineering, California Institute of Technology, Pasadena, California 91125

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Issue

Vol. 28, Iss. 6 — 15 September 1983

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