Hot-electron picture of light emission from tunnel junctions

J. R. Kirtley, T. N. Theis, J. C. Tsang, and D. J. DiMaria
Phys. Rev. B 27, 4601 – Published 15 April 1983
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Abstract

Metal-insulator-metal tunnel junctions emit optical radiation when biased at voltages in the range 2-4 V. We argue that a complete picture of this radiation process includes hot electrons, which excite surface electromagnetic resonances, which are in turn coupled to external radiation through surface roughness. This picture is supported by measurements of the temperature and second-metal-electrode thickness dependence of the emission intensities, and by light emission from surface plasmons excited by optical pumping and by charge injection.

  • Received 8 November 1982

DOI:https://doi.org/10.1103/PhysRevB.27.4601

©1983 American Physical Society

Authors & Affiliations

J. R. Kirtley, T. N. Theis, J. C. Tsang, and D. J. DiMaria

  • IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598

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Vol. 27, Iss. 8 — 15 April 1983

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