Surface-enhanced Raman scattering from molecules in tunnel junctions

J. C. Tsang, J. R. Kirtley, T. N. Theis, and S. S. Jha
Phys. Rev. B 25, 5070 – Published 15 April 1982
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Abstract

Surface-enhanced Raman scattering from molecular monolayers adsorbed at the aluminum oxide—Ag interface of tunnel junctions has been studied as a function of the junction parameters and surface roughness. The surface-plasmon—polariton contribution to surface-enhanced Raman scattering from this system is quantitatively demonstrated in experiments on samples fabricated on holographic diffraction gratings. The existence of a short-range contribution to the surface-enhanced Raman effect is also shown and compared with the predictions of the modulated surface dipole mechanism of Jha, Kirtley, and Tsang.

  • Received 11 May 1981

DOI:https://doi.org/10.1103/PhysRevB.25.5070

©1982 American Physical Society

Authors & Affiliations

J. C. Tsang, J. R. Kirtley, T. N. Theis, and S. S. Jha*

  • IBM T. J. Watson Research Center, P. O. Box 218, Yorktown Heights, New York 10598

  • *Present address: Tata Institute of Fundamental Research, Bombay, India.

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Issue

Vol. 25, Iss. 8 — 15 April 1982

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