Light emission from tunnel junctions on gratings

John Kirtley, T. N. Theis, and J. C. Tsang
Phys. Rev. B 24, 5650 – Published 15 November 1981
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Abstract

We present measurements of light emission from Al-Al2O3-Ag tunnel junctions on holographically produced, sinusoidal profile gratings. Sharp angle tunable emission peaks result from coupling out of the Ag-vacuum fast surface-plasmon polariton by the grating structure. The dependences of the emission intensities on angle, frequency, bias voltage and current, and grating amplitudes agree well with a recent theory by Laks and Mills [Phys. Rev. B 22, 5723 (1980)]. The absolute intensities and dependence of intensities on Ag-film thickness do not agree as well. We propose a possible explanation for this discrepancy. PACS numbers 1977 73.40.Rw, 78.65.Ez BD2092

  • Received 24 April 1981

DOI:https://doi.org/10.1103/PhysRevB.24.5650

©1981 American Physical Society

Authors & Affiliations

John Kirtley, T. N. Theis, and J. C. Tsang

  • IBM T. J. Watson Research Center, Yorktown Heights, New York 10598

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Issue

Vol. 24, Iss. 10 — 15 November 1981

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