Abstract
We report on Landau-level spectroscopy of an epitaxially grown thin film of the topological insulator , complemented by ellipsometry and magnetotransport measurements. The observed response suggests that is a direct-gap semiconductor with the fundamental band gap located at the point or along the trigonal axis, and its width reaches meV at low temperatures. Our data also indicate the presence of other low-energy extrema with a higher multiplicity in both the conduction and valence bands. The conclusions based on our experimental data are confronted with and to a great extent corroborated by the electronic band structure calculated using the method.
2 More- Received 12 December 2023
- Accepted 15 March 2024
DOI:https://doi.org/10.1103/PhysRevB.109.165205
Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.
Published by the American Physical Society