Magnetic field driven redistribution between extended and localized electronic states in high-mobility Si MOSFETs at low temperatures

V. M. Pudalov and M. E. Gershenson
Phys. Rev. B 104, 035407 – Published 6 July 2021

Abstract

In the study of oscillatory electron transport in high-mobility Si MOSFETs at low temperatures we observe two correlated effects in weak in-plane magnetic fields: a steep decrease of the magnetic susceptibility χ*(H) and an increase of the concentration of mobile carriers n(H). We suggest a phenomenological model of the magnetic field driven redistribution between the extended and localized electronic states that qualitatively explains both effects. We argue that the redistribution is mainly caused by magnetization of the large-spin S2 localized states with energies close to the Fermi energy EF, coexisting with the majority Fermi liquid state. Our findings also resolve a long-standing disagreement between the experimental data on χ* obtained in weak (HkBT/μB) and strong (HEF/gμB) magnetic fields.

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  • Received 11 February 2021
  • Revised 21 June 2021
  • Accepted 23 June 2021

DOI:https://doi.org/10.1103/PhysRevB.104.035407

©2021 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

V. M. Pudalov1,3 and M. E. Gershenson2

  • 1V. L. Ginzburg Research Center for High Temperature Superconductivity and Quantum Materials, P. N. Lebedev Physical Institute, 119991 Moscow, Russia
  • 2Serin Physics Lab, Rutgers University, Piscataway New Jersey 08854, USA
  • 3HSE University, 101000 Moscow, Russia

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Issue

Vol. 104, Iss. 3 — 15 July 2021

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