Chemical trend of a Cu impurity in Zn chalcogenides

Yang Yang, Peng Zhang, Jingxiu Yang, and Su-Huai Wei
Phys. Rev. B 101, 174101 – Published 1 May 2020

Abstract

Cu is usually considered as an effective dopant to introduce shallow acceptors in Zn chalcogenides because it is on the left-hand side of Zn in the Periodic Table. Here, using first-principles calculations based on the hybrid functional with spin polarization, we show that contrary to the common expectation, Cu substituting Zn (CuZn) in bulk Zn chalcogenides actually generates rather deep acceptor levels in ZnO, ZnS, and ZnSe, i.e., 2.91, 1.03, and 0.53 eV above the valence-band maximum (VBM), respectively, except in ZnTe (0.13 eV). More interestingly, the absolute Cu impurity energy level does not follow the variation of the VBM, decreasing from ZnTe to ZnSe to ZnS to ZnO, instead, it is the highest in ZnO. The abnormal behavior of CuZn in ZnO is attributed to the fact that, due to the very low O 2p-orbital energy, the CuZn defect wave function has dominantly localized the Cu 3d-orbital component, whereas in other Zn chalcogenides, anion p states are dominant. The localized Cu 3d state leads to the enhanced exchange energy that elevates the acceptor level, which explains why the Cu impurity level is abnormally deep in ZnO. This finding provides insight in designing shallow acceptor levels in II–VI semiconductors.

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  • Received 13 February 2020
  • Revised 9 April 2020
  • Accepted 16 April 2020

DOI:https://doi.org/10.1103/PhysRevB.101.174101

©2020 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Yang Yang1, Peng Zhang2,*, Jingxiu Yang3,†, and Su-Huai Wei1,‡

  • 1Beijing Advanced Innovation Center for Materials Genome Engineering, Beijing Computational Science Research Center, Beijing, 100193, China
  • 2College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, Guangdong 518060, China
  • 3School of Materials Science and Engineering, Jilin Jianzhu University, Changchun 130118, China

  • *pengzhang@szu.edu.cn
  • yangjingxiu@jlju.edu.cn
  • suhuaiwei@csrc.ac.cn

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Issue

Vol. 101, Iss. 17 — 1 May 2020

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