Electronic, vibrational, elastic, and piezoelectric properties of monolayer Janus MoSTe phases: A first-principles study

M. Yagmurcukardes, C. Sevik, and F. M. Peeters
Phys. Rev. B 100, 045415 – Published 19 July 2019

Abstract

By performing density functional theory based first-principles calculations, the electronic, vibrational, elastic, and piezoelectric properties of two dynamically stable crystal phases of monolayer Janus MoSTe, namely 1H-MoSTe and 1T-MoSTe, are investigated. Vibrational frequency analysis reveals that the other possible crystal structure, 1T-MoSTe, of this Janus monolayer does not exhibit dynamical stability. The 1H-MoSTe phase is found to be an indirect band-gap semiconductor while 1T-MoSTe is predicted as small-gap semiconductor. Notably, in contrast to the direct band-gap nature of monolayers 1HMoS2 and 1HMoTe2, 1H-MoSTe is found to be an indirect gap semiconductor driven by the induced surface strains on each side of the structure. The calculated Raman spectrum of each structure shows unique character enabling us to clearly distinguish the stable crystal phases via Raman measurements. The systematic piezoelectric stress and strain coefficient analysis reveals that out-of-plane piezoelectricity appears in 1H-MoSTe and the noncentral symmetric 1T-MoSTe has large piezoelectric coefficients. Static total-energy calculations show clearly that the formation of 1T-MoSTe is feasible by using 1TMoTe2 as a basis monolayer. Therefore, we propose that the Janus MoSTe structure can be fabricated in two dynamically stable phases which possess unique electronic, dynamical, and piezoelectric properties.

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  • Received 13 May 2019

DOI:https://doi.org/10.1103/PhysRevB.100.045415

©2019 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

M. Yagmurcukardes1,*, C. Sevik2, and F. M. Peeters1

  • 1Department of Physics, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium
  • 2Department of Mechanical Engineering, Faculty of Engineering, Eskişehir Technical University, Eskisehir, TR 26555, Turkey

  • *mehmet.yagmurcukardes@uantwerpen.be

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Vol. 100, Iss. 4 — 15 July 2019

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