Three-Dimensional Modeling of Minority-Carrier Lateral Diffusion Length Including Random Alloy Fluctuations in (In,Ga)N and (Al,Ga)N Single Quantum Wells

Huan-Ting Shen, Claude Weisbuch, James S. Speck, and Yuh-Renn Wu
Phys. Rev. Applied 16, 024054 – Published 27 August 2021

Abstract

For nitride-based (In,Ga)N and (Al,Ga)N quantum-well (QW) light-emitting diodes (LEDs), the potential fluctuations caused by natural alloy disorders limit the lateral intra-QW carrier diffusion length and current spreading. The diffusion length mainly impacts the overall LED efficiency through sidewall nonradiative recombination, especially for μLEDs. In this paper, we study the carrier lateral diffusion length for nitride-based green, blue, and ultraviolet C (UVC) QWs in three dimensions. We solve the Poisson and drift-diffusion equations in the framework of localization landscape theory. The full three-dimensional model includes the effects of random alloy composition fluctuations and electric fields in the QWs. The dependence of the minority carrier diffusion length on the majority carrier density is studied with a full three-dimensional model. The results show that the diffusion length is limited by the potential fluctuations and the recombination rate, the latter being controlled by the spontaneous and piezoelectric fields in the QWs and by the screening of the internal electric fields by carriers.

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  • Received 21 May 2021
  • Revised 2 August 2021
  • Accepted 6 August 2021

DOI:https://doi.org/10.1103/PhysRevApplied.16.024054

© 2021 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied PhysicsInterdisciplinary Physics

Authors & Affiliations

Huan-Ting Shen1, Claude Weisbuch2,3, James S. Speck2, and Yuh-Renn Wu1,*

  • 1Graduate Institute of Photonics and Optoelectronics and Department of Electrical Engineering, National Taiwan University, Taipei 10617, Taiwan
  • 2Materials Department, University of California, Santa Barbara, California 93106-5050, USA
  • 3Laboratoire de Physique de la Matière Condensée, Ecole Polytechnique, CNRS, IP Paris, 91128 Palaiseau Cedex, France

  • *yrwu@ntu.edu.tw

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Vol. 16, Iss. 2 — August 2021

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