• Open Access

High-resolution cavity bunch arrival-time monitor for charges less than 1 pC

Chuangye Song, Yanqing Jia, Zhuoyuan Liu, Yingchao Du, and Wenhui Huang
Phys. Rev. Accel. Beams 26, 012803 – Published 18 January 2023

Abstract

Pump-probe experiments using x-ray pulses or MeV ultrafast electrons as probes are important for studying ultrafast dynamic processes at the atomic level. Increasing demand is being focused on ultrashort x-ray pulses and electron pulses to research processes down to a few femtoseconds. Due to the limitation of the space charge force, only low charge electron bunches with critical synchronization can achieve such short pulses. A high-precision beam arrival-time monitor for the low charge is especially important. In this paper, a low Ql cavity with high sensitivity is designed to measure the arrival time of charges below 1 pC. The pickup is particularly optimized with high R/Q at 4.76 GHz to provide the maximum signal, and the cold test results are in good agreement with the simulations. An IQ demodulation scheme is developed for the readout electronics. In the beam tests, the measured resolution of the beam arrival-time monitor is 33.46 fs at 0.5 pC.

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  • Received 20 September 2022
  • Accepted 4 January 2023

DOI:https://doi.org/10.1103/PhysRevAccelBeams.26.012803

Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.

Published by the American Physical Society

Physics Subject Headings (PhySH)

Accelerators & Beams

Authors & Affiliations

Chuangye Song, Yanqing Jia, Zhuoyuan Liu, Yingchao Du, and Wenhui Huang*

  • Department of Engineering Physics, Tsinghua University Beijing, Beijing 100084, People’s Republic of China and Key Laboratory of Particle and Radiation Imaging, Tsinghua University, Ministry of Education, Beijing 100084, People’s Republic of China

  • *huangwh@mail.tsinghua.edu.cn

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Issue

Vol. 26, Iss. 1 — January 2023

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