• Open Access

Linear voltage recovery after a breakdown in a pulsed dc system

Anton Saressalo, Dan Wang, and Flyura Djurabekova
Phys. Rev. Accel. Beams 24, 113101 – Published 29 November 2021

Abstract

Breakdowns (BDs) may occur in high-voltage applications even in ultrahigh vacuum conditions. Previously, we showed that it is important to pay attention to the post-BD voltage recovery in order to limit the appearance of secondary BDs associated with the primary ones. This can improve the overall efficiency of the high-voltage device. In this study, we focus on the optimization of the linear post-BD voltage recovery, with the principle aim of alleviating the problem of the secondary BDs. We investigate voltage recovery scenarios with different starting voltages and slopes of linear voltage increase by using a pulsed dc system. We find that a higher number of pulses during the voltage recovery produces fewer secondary BDs and a lower overall BD rate. Lowering the number of pulses led to more dramatic voltage recovery resulting in higher BD rates. A steeper voltage increase rate led to a more localized occurrence of the secondary BDs near the end of the voltage recovery period. It was also found that the peak BD probability is regularly observed around 1 s after the end of the ramping period and that its value decreases exponentially with the amount of energy put into the system during the ramping. The value also decays exponentially with a half-life of (1.4±0.3) ms if the voltage only increased between the voltage recovery steps.

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  • Received 27 August 2021
  • Accepted 12 November 2021

DOI:https://doi.org/10.1103/PhysRevAccelBeams.24.113101

Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.

Published by the American Physical Society

Physics Subject Headings (PhySH)

Accelerators & Beams

Authors & Affiliations

Anton Saressalo1,*, Dan Wang1,2, and Flyura Djurabekova1

  • 1Helsinki Institute of Physics and Department of Physics, University of Helsinki, PO Box 43 (Pietari Kalmin katu 2), 00014 Helsingin yliopisto, Finland
  • 2State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an 710049, China

  • *anton.saressalo@helsinki.fi

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Vol. 24, Iss. 11 — November 2021

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