• Open Access

Extreme regimes of femtosecond photoemission from a copper cathode in a dc electron gun

P. L. E. M. Pasmans, D. C. van Vugt, J. P. van Lieshout, G. J. H. Brussaard, and O. J. Luiten
Phys. Rev. Accel. Beams 19, 103403 – Published 26 October 2016

Abstract

The femtosecond photoemission yield from a copper cathode and the emittance of the created electron beams has been studied in a 12MeV/m, 100 keV dc electron gun over a wide range of laser fluence, from the linear photoemission regime until the onset of image charge limitations and cathode damaging. The measured photoemission curves can be described well with available theory which includes the Schottky effect, second-order photoemission, and image charge limitation. The second-order photoemission can be explained by thermally assisted one-photon photoemission (1PPE) and by above-threshold two-photon photoemission (2PPE). Measurements with a fresh cathode suggest that the 2PPE process is dominant. The beam emittance has been measured for the entire range of initial surface charge densities as well. The emittance measurements of space-charge dominated beams can be described well by an envelope equation with generalized perveance. The dc gun produces 0.1 pC bunches with 25 nm rms normalized emittance, corresponding to a normalized brightness usually associated with rf photoguns. In this experimental study the limits of femtosecond photoemission from a copper cathode have been explored and analyzed in great detail, resulting in improved understanding of the underlying mechanisms.

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  • Received 18 August 2016

DOI:https://doi.org/10.1103/PhysRevAccelBeams.19.103403

Published by the American Physical Society under the terms of the Creative Commons Attribution 3.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.

Published by the American Physical Society

Physics Subject Headings (PhySH)

  1. Research Areas
Accelerators & Beams

Authors & Affiliations

P. L. E. M. Pasmans1, D. C. van Vugt1, J. P. van Lieshout1, G. J. H. Brussaard1, and O. J. Luiten1,2,*

  • 1Department of Applied Physics, Eindhoven University of Technology, P.O. Box 13, 5600 MB Eindhoven, The Netherlands
  • 2Institute of Complex Molecular Systems, Eindhoven University of Technology, P.O. Box 13, 5600 MB Eindhoven, The Netherlands

  • *o.j.luiten@tue.nl

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Vol. 19, Iss. 10 — October 2016

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