Fano lines in the reflection spectrum of directly coupled systems of waveguides and cavities: Measurements, modeling, and manipulation of the Fano asymmetry

Jin Lian, Sergei Sokolov, Emre Yüce, Sylvain Combrié, Alfredo De Rossi, and Allard P. Mosk
Phys. Rev. A 96, 033812 – Published 8 September 2017

Abstract

We measured and analyzed reflection spectra of directly coupled systems of waveguides and cavities. The observed Fano lines offer insight on the reflection and coupling processes. Very different from side-coupled systems, the observed Fano line shape is not caused by the termini of the waveguide but by the coupling process between the measurement device fiber and the waveguide. Our experimental results and analytical model show that the Fano parameter that describes the Fano line shape is very sensitive to the coupling condition. A movement of the fiber well below the Rayleigh range can lead to a drastic change of the Fano line shape.

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  • Received 27 October 2016
  • Revised 27 June 2017

DOI:https://doi.org/10.1103/PhysRevA.96.033812

©2017 American Physical Society

Physics Subject Headings (PhySH)

Atomic, Molecular & Optical

Authors & Affiliations

Jin Lian1,2,*, Sergei Sokolov1,2, Emre Yüce2,3, Sylvain Combrié4, Alfredo De Rossi4, and Allard P. Mosk1

  • 1Nanophotonics, Debye Institute for Nanomaterials Science, Center for Extreme Matter and Emergent Phenomena, Utrecht University, P.O. Box 80.000, 3508 TA Utrecht, The Netherlands
  • 2Complex Photonic Systems, MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, 7500AE Enschede, The Netherlands
  • 3Light and Matter Control Group, Department of Physics, Middle East Technical University, 06800 Ankara, Turkey
  • 4Thales Research and Technology, Route Départementale 128, 91767 Palaiseau, France

  • *Corresponding author: iamjinlian@gmail.com.

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Issue

Vol. 96, Iss. 3 — September 2017

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