• Rapid Communication

Theoretical determination of two-electron one-photon transition characteristics for low-Z K-shell hollow atoms

Karol Kozioł and Jacek Rzadkiewicz
Phys. Rev. A 96, 031402(R) – Published 14 September 2017

Abstract

Studying K-shell hollow atom spectra broadens our knowledge on femtosecond phenomena in atomic physics, chemistry, and biology. Recent synchrotron measurements of the two-electron one-photon (TEOP) transitions of low-Z atoms have shown discrepancies between experiment and theoretical predictions of the TEOP relative intensities and their linewidths. The discrepancies seem to be a result of an incomplete description of an atomic response to the strong perturbation due to the K-shell double photoionization (DPI). A theoretical attempt, based on the multiconfiguration Dirac-Fock relativistic configuration interaction method, is presented for Mg, Al, and Si atoms. It is demonstrated that both the branching ratios and the TEOP linewidths can be closely reproduced by taking into account the influences of the core and valence electron correlations, open-shell valence configuration, and the outer-shell ionization and excitation processes following the K-shell DPI.

  • Figure
  • Figure
  • Figure
  • Received 22 June 2017

DOI:https://doi.org/10.1103/PhysRevA.96.031402

©2017 American Physical Society

Physics Subject Headings (PhySH)

Atomic, Molecular & Optical

Authors & Affiliations

Karol Kozioł* and Jacek Rzadkiewicz

  • Narodowe Centrum Badań Jądrowych (NCBJ), Andrzeja Sołtana 7, 05-400 Otwock-Świerk, Poland

  • *Karol.Koziol@ncbj.gov.pl
  • Jacek.Rzadkiewicz@ncbj.gov.pl

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 96, Iss. 3 — September 2017

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review A

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×