Quantum metrology matrix

Haidong Yuan and Chi-Hang Fred Fung
Phys. Rev. A 96, 012310 – Published 7 July 2017

Abstract

Various strategies exist in quantum metrology, such as with or without ancillary system, with a fixed or optimized measurement, with or without monitoring the environment, etc. Different set of tools are usually needed for different strategies. In this article, we provide a unified framework for these different settings, in particular we introduce a quantum metrology matrix and show that the precision limits of different settings can all be obtained from the trace or the trace norm of the quantum metrology matrix. Furthermore, the probe state enters into the quantum metrology matrix linearly, which makes the identification of the optimal probe states, one of the main quests in quantum metrology, much more efficient than conventional methods.

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  • Received 28 November 2016

DOI:https://doi.org/10.1103/PhysRevA.96.012310

©2017 American Physical Society

Physics Subject Headings (PhySH)

Quantum Information, Science & TechnologyGeneral Physics

Authors & Affiliations

Haidong Yuan*

  • Department of Mechanical and Automation Engineering, The Chinese University of Hong Kong, Shatin, Hong Kong

Chi-Hang Fred Fung

  • German Research Center, Huawei Technologies Düsseldorf GmbH 80992, Germany

  • *hdyuan@mae.cuhk.edu.hk
  • fred.fung@huawei.com

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Vol. 96, Iss. 1 — July 2017

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