Strong-field effects in the photoemission spectrum of the C60 fullerene

C.-Z. Gao, P. M. Dinh, P. Klüpfel, C. Meier, P.-G. Reinhard, and E. Suraud
Phys. Rev. A 93, 022506 – Published 10 February 2016

Abstract

Considering C60 as a model system for describing field emission from the extremity of a carbon nanotip, we explore electron emission from this fullerene excited by an intense, near-infrared, few-cycle laser pulse (10131014W/cm2, 912 nm, 8-cycle). To this end, we use time-dependent density functional theory augmented by a self-interaction correction. The ionic background of C60 is described by a soft jellium model. Particular attention is paid to the high-energy electrons. Comparing the spectra at different emission angles, we find that, as a major result of this study, the photoelectrons are strongly peaked along the laser polarization axis forming a highly collimated electron beam in the forward direction, especially for the high-energy electrons. Moreover, the high-energy plateau cutoff found in the simulations agrees well with estimates from the classical three-step model. We also investigate the buildup of the high-energy part of a photoelectron spectrum by a time-resolved analysis. In particular, the modulation on the plateau can be interpreted as contributions from intracycle and intercycle interferences.

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  • Received 18 June 2015
  • Revised 15 October 2015

DOI:https://doi.org/10.1103/PhysRevA.93.022506

©2016 American Physical Society

Physics Subject Headings (PhySH)

Atomic, Molecular & Optical

Authors & Affiliations

C.-Z. Gao1,2, P. M. Dinh1,2,*, P. Klüpfel3, C. Meier3, P.-G. Reinhard4, and E. Suraud1,2

  • 1Université de Toulouse; UPS; Laboratoire de Physique Théorique, IRSAMC; F-31062 Toulouse Cedex, France
  • 2CNRS; UMR5152; F-31062 Toulouse Cedex, France
  • 3Université de Toulouse; UPS; Laboratoire Collisions-Agrégats-Réactivité, IRSAMC; F-31062 Toulouse Cedex, France
  • 4Institut für Theoretische Physik, Universität Erlangen, Staudtstraße 7, D-91058 Erlangen, Germany

  • *Corresponding author: dinh@irsamc.ups-tlse.fr

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Issue

Vol. 93, Iss. 2 — February 2016

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