Consistency tests of classical and quantum models for a quantum annealer

Tameem Albash, Walter Vinci, Anurag Mishra, Paul A. Warburton, and Daniel A. Lidar
Phys. Rev. A 91, 042314 – Published 13 April 2015

Abstract

Recently the question of whether the D-Wave processors exhibit large-scale quantum behavior or can be described by a classical model has attracted significant interest. In this work we address this question by studying a 503-qubit D-Wave Two device in the “black box” model i.e., by studying its input-output behavior. Our work generalizes an approach introduced in Boixo et al. [Nat. Commun. 4, 2067 (2013)] and uses groups of up to 20 qubits to realize a transverse Ising model evolution with a ground-state degeneracy whose distribution acts as a sensitive probe that distinguishes classical and quantum models for the D-Wave device. Our findings rule out all classical models proposed to date for the device and provide evidence that an open-system quantum dynamical description of the device that starts from a quantized energy level structure is well justified, even in the presence of relevant thermal excitations and a small value of the ratio of the single-qubit decoherence time to the annealing time.

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  • Received 19 November 2014

DOI:https://doi.org/10.1103/PhysRevA.91.042314

©2015 American Physical Society

Authors & Affiliations

Tameem Albash1,2,3, Walter Vinci2,4,5, Anurag Mishra1,2, Paul A. Warburton4,6, and Daniel A. Lidar1,2,7,8

  • 1Department of Physics and Astronomy, University of Southern California, Los Angeles, California 90089, USA
  • 2Center for Quantum Information Science & Technology, University of Southern California, Los Angeles, California 90089, USA
  • 3Information Sciences Institute, University of Southern California, Marina del Rey, California 90292
  • 4London Centre for Nanotechnology, University College London, WC1H 0AH London, United Kingdom
  • 5Department of Computer Science, University College London, WC1E 6BT London, United Kingdom
  • 6Department of Electronic & Electrical Engineering, University College London, WC1E 7JE London, United Kingdom
  • 7Department of Electrical Engineering, University of Southern California, Los Angeles, California 90089, USA
  • 8Department of Chemistry, University of Southern California, Los Angeles, California 90089, USA

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Issue

Vol. 91, Iss. 4 — April 2015

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