Abstract
We present extreme-ultraviolet (EUV) fluorescence spectra of Ar clusters irradiated by intense EUV free-electron-laser (FEL) pulses focused to intensities of up to at a wavelength of 51 nm. The spectra reveal fluorescence at wavelengths shorter than that of the incident radiation, which can be assigned to EUV fluorescence lines from excited multiply charged ions with as high as 6. This demonstrates that charge states as high as 7+ are produced by the FEL irradiation. The dependence of the spectra on cluster size shows that the highly charged ions are generated at the cluster surface, indicating inhomogeneous charging. The FEL power dependencies of the spectral features suggest that the inhomogeneous distribution of charge within the clusters reduces ionization thresholds at the cluster surface.
- Received 20 June 2014
- Revised 19 September 2014
DOI:https://doi.org/10.1103/PhysRevA.91.021402
©2015 American Physical Society