Lévy exponents as universal identifiers of threshold and criticality in random lasers

Ravitej Uppu and Sushil Mujumdar
Phys. Rev. A 90, 025801 – Published 18 August 2014

Abstract

Critical excitation in random lasers under picosecond and nanosecond pumping was experimentally studied. The resulting emission intensity statistics were analyzed using fits to α-stable distributions. We find that the transition value of α, the tail exponent of the stable distribution, is a clear indicator of the threshold of random lasing. We discuss this exponent as an identifier of the threshold. This definition is compared with the conventional definitions for the threshold, namely, the probability of random lasing in the case of coherent random lasers and the intensity enhancement and bandwidth collapse for diffusive random lasing emission. We find a universal applicability of the α exponent as an identifier of the threshold, and hence the criticality, in random lasers.

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  • Received 29 June 2014

DOI:https://doi.org/10.1103/PhysRevA.90.025801

©2014 American Physical Society

Authors & Affiliations

Ravitej Uppu and Sushil Mujumdar*

  • Nano-Optics and Mesoscopic Optics Laboratory, Tata Institute of Fundamental Research, 1, Homi Bhabha Road, Colaba, Mumbai 400005, India

  • *mujumdar@tifr.res.in; http://www.tifr.res.in/~mujumdar

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Vol. 90, Iss. 2 — August 2014

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