Abstract
A method is described to measure photoexcitation cross sections, relying on the expected behavior of the signal in the saturated regime, when excitation is provided by a Gaussian light beam. The method is implemented on a negative ion beam, with a single-mode pulsed Nd:YAG laser, to make a laser measurement of the photodetachment cross section of , at the wavelength 1064 nm. This cross section is of importance both as a photodetachment cross section of the most elementary negative ion and as a key parameter for the production of fast neutral or atoms, by photodetachment of accelerated anions. The obtained value is greater than the one known from older measurements and most ab initio calculations.
- Received 28 April 2014
DOI:https://doi.org/10.1103/PhysRevA.90.013411
©2014 American Physical Society