Hard-x-ray spectrographs with resolution beyond 100 μeV

Yuri Shvyd'ko, Stanislav Stoupin, Kiran Mundboth, and Jungho Kim
Phys. Rev. A 87, 043835 – Published 25 April 2013

Abstract

Spectrographs take snapshots of photon spectra with array detectors by dispersing photons of different energies into distinct directions and spatial locations. Spectrographs require optics with a large angular dispersion rate as the key component. In visible light optics, diffraction gratings are used for this purpose. In the hard-x-ray regime, achieving large dispersion rates is a challenge. Here we show that multicrystal, multi-Bragg-reflection arrangements feature cumulative angular dispersion rates almost two orders of magnitude larger than those attainable with a single-Bragg reflection. As a result, the multicrystal arrangements become potential dispersing elements of hard-x-ray spectrographs. The hard-x-ray spectrograph principles are demonstrated by imaging a spectrum of photons with a record high resolution of ΔE90 μeV in the hard-x-ray regime, using multicrystal optics as the dispersing element. The spectrographs can boost research using inelastic ultrahigh-resolution x-ray spectroscopies with synchrotrons and seeded x-ray free electron lasers.

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  • Received 15 October 2012

DOI:https://doi.org/10.1103/PhysRevA.87.043835

©2013 American Physical Society

Authors & Affiliations

Yuri Shvyd'ko1,*, Stanislav Stoupin1, Kiran Mundboth2, and Jungho Kim1

  • 1Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA
  • 2Diamond Light Source Ltd, Didcot Oxfordshire OX11 0DE, United Kingdom

  • *shvydko@aps.anl.gov

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Vol. 87, Iss. 4 — April 2013

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