Abstract
We report the experimental observation of fine interference patterns in a reflection profile of a focused laser beam when it undergoes total internal reflection from a dielectric interface near its critical angle. In addition, we show that similar interference structures routinely appear in the reflection profile when long-range optical surface waves are excited at the plane interface by the focused laser beam. In both cases these interference patterns do not appear at all if the incident beam may be reckoned as a plane wave, that is, when the waist of the focused beam is much larger than the Goos-Hänchen shift or the surface wave propagation length correspondingly. A modified formula for the Goos-Hänchen shift is presented, and it is shown that a maximum value of the shift may reach several tens of microns for wide beams.
- Received 14 July 2012
DOI:https://doi.org/10.1103/PhysRevA.86.063807
©2012 American Physical Society