Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti

Silvina P. Limandri, M. A. Z. Vasconcellos, Ruth Hinrichs, and Jorge C. Trincavelli
Phys. Rev. A 86, 042701 – Published 2 October 2012

Abstract

Cross sections for K-shell ionization by electron impact were determined from films of Al, Si, and Ti and their oxides deposited on carbon substrates, for incident energies between 2.5 and 25 keV. The spectral processing of the x-ray emission spectra took into account corrections due to the presence of a spontaneous oxide layer formed on the monoelemental films and to the supporting material. Carbon K-shell ionization cross sections were determined from the contribution of the substrate to the measured spectra, while for oxygen, data from the three oxide films were taken. The mass thickness of the coatings was characterized by x-ray reflectivity. The results obtained were compared with other experimental data sets, semiempirical approaches, and theoretical models.

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  • Received 6 June 2012

DOI:https://doi.org/10.1103/PhysRevA.86.042701

©2012 American Physical Society

Authors & Affiliations

Silvina P. Limandri1,2, M. A. Z. Vasconcellos3, Ruth Hinrichs4, and Jorge C. Trincavelli2,5

  • 1Centro Atómico Bariloche, Comisión Nacional de Energía Atómica, San Carlos de Bariloche (8400), Río Negro, Argentina
  • 2Consejo Nacional de Investigaciones Científicas y Técnicas (CONICET), Argentina
  • 3Instituto de Física, Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Rio Grande do Sul, Brazil
  • 4Instituto de Geociências, UFRGS, Porto Alegre, Rio Grande do Sul, Brazil
  • 5Facultad de Matemática, Astronomía y Física, Universidad Nacional de Córdoba, Ciudad Universitaria (5000), Córdoba, Argentina

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Issue

Vol. 86, Iss. 4 — October 2012

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