Localization length of nearly periodic layered metamaterials

O. del Barco and M. Ortuño
Phys. Rev. A 86, 023846 – Published 27 August 2012

Abstract

We have analyzed numerically the localization length of light ξ for nearly periodic arrangements of homogeneous stacks (formed exclusively by right-handed materials) and mixed stacks (with alternating right- and left-handed metamaterials). Layers with index of refraction n1 and thickness L1 alternate with layers of index of refraction n2 and thickness L2. Positional disorder has been considered by shifting randomly the positions of the layer boundaries with respect to periodic values. For homogeneous stacks, we have shown that the localization length is modulated by the corresponding bands and that ξ is enhanced at the center of each allowed band. In the limit of long wavelengths λ, the parabolic behavior previously found in purely disordered systems is recovered, whereas for λL1+L2 a saturation is reached. In the case of nearly periodic mixed stacks with the condition |n1L1|=|n2L2|, instead of bands there is a periodic arrangement of Lorenztian resonances, which again is reflected in the behavior of the localization length. For wavelengths of several orders of magnitude greater than L1+L2, the localization length ξ depends linearly on λ with a slope inversely proportional to the modulus of the reflection amplitude between alternating layers. When the condition |n1L1|=|n2L2| is no longer satisfied, the transmission spectrum is very irregular and this considerably affects the localization length.

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  • Received 18 June 2012

DOI:https://doi.org/10.1103/PhysRevA.86.023846

©2012 American Physical Society

Authors & Affiliations

O. del Barco and M. Ortuño

  • Departamento de Física, CIOyN, Universidad de Murcia, Spain

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Issue

Vol. 86, Iss. 2 — August 2012

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