Ejected-electron spectroscopy of autoionizing resonances of helium excited by fast-electron impact

Zhe Zhang, Xu Shan, Enliang Wang, and Xiangjun Chen
Phys. Rev. A 85, 062702 – Published 13 June 2012

Abstract

The autoionizing resonances (2s2)1S, (2p2)1D, and (2s2p)1P of helium have been investigated employing ejected-electron spectroscopy by fast-electron impact at incident energies of 250–2000 eV and ejected angles of 26°–116°. Shore parameters of the line shapes for these three resonances have been obtained in such high incident energy regime except at 250 eV. Distinct discrepancies between the present results at 250 eV and those of McDonald and Crowe at 200 eV [D. G. McDonald and A. Crowe, J. Phys. B 25, 2129 (1992); D. G. McDonald and A. Crowe, J. Phys. B 25, 4313 (1992)] and Sise et al. at 250 eV [O. Sise, M. Dogan, I. Okur, and A. Crowe, Phys. Rev. A 84, 022705 (2011)], especially for 1D and 1P states, are also observed.

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  • Received 26 March 2012

DOI:https://doi.org/10.1103/PhysRevA.85.062702

©2012 American Physical Society

Authors & Affiliations

Zhe Zhang, Xu Shan, Enliang Wang, and Xiangjun Chen*

  • Hefei National Laboratory for Physical Science at Microscale, University of Science and Technology of China, Hefei 230026, China
  • Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China

  • *xjun@ustc.edu.cn

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Issue

Vol. 85, Iss. 6 — June 2012

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