Finite-geometry models of electric field noise from patch potentials in ion traps

Guang Hao Low, Peter F. Herskind, and Isaac L. Chuang
Phys. Rev. A 84, 053425 – Published 22 November 2011

Abstract

We model electric field noise from fluctuating patch potentials on conducting surfaces by taking into account the finite geometry of the ion trap electrodes to gain insight into the origin of anomalous heating in ion traps. The scaling of anomalous heating rates with surface distance d is obtained for several generic geometries of relevance to current ion trap designs, ranging from planar to spheroidal electrodes. The influence of patch size is studied both by solving Laplace's equation in terms of the appropriate Green's function as well as through an eigenfunction expansion. Scaling with surface distance is found to be highly dependent on the choice of geometry and the relative scale between the spatial extent of the electrode, the ion-electrode distance, and the patch size. Our model generally supports the d4 dependence currently found by most experiments and models, but also predicts geometry-driven deviations from this trend.

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  • Received 14 September 2011

DOI:https://doi.org/10.1103/PhysRevA.84.053425

©2011 American Physical Society

Authors & Affiliations

Guang Hao Low1,2, Peter F. Herskind1, and Isaac L. Chuang1

  • 1MIT-Harvard Center for Ultracold Atoms, Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
  • 2Department of Physics, Cavendish Laboratory, J. J. Thomson Avenue, Cambridge, CB3 0HE, United Kingdom

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Vol. 84, Iss. 5 — November 2011

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