Trap-depth determination from residual gas collisions

J. Van Dongen, C. Zhu, D. Clement, G. Dufour, J. L. Booth, and K. W. Madison
Phys. Rev. A 84, 022708 – Published 16 August 2011

Abstract

We present a method for determining the depth of an atomic or molecular trap of any type. This method relies on a measurement of the trap loss rate induced by collisions with background gas particles. Given a fixed gas composition, the loss rate uniquely determines the trap depth. Because of the “soft” long-range nature of the van der Waals interaction, these collisions transfer kinetic energy to trapped particles across a broad range of energy scales, from room temperature to the microkelvin energy scale. The resulting loss rate therefore exhibits a significant variation over an enormous range of trap depths, making this technique a powerful diagnostic with a large dynamic range. We present trap depth measurements of a Rb magneto-optical trap using this method and a different technique that relies on measurements of loss rates during optical excitation of colliding atoms to a repulsive molecular state. The main advantage of the method presented here is its large dynamic range and applicability to traps of any type requiring only knowledge of the background gas density and the interaction potential between the trapped and background gas particles.

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  • Received 25 June 2010

DOI:https://doi.org/10.1103/PhysRevA.84.022708

©2011 American Physical Society

Authors & Affiliations

J. Van Dongen1, C. Zhu1, D. Clement1, G. Dufour1, J. L. Booth2, and K. W. Madison1,*

  • 1Department of Physics & Astronomy, University of British Columbia, 6224 Agricultural Road, Vancouver, British Columbia, Canada V6T 1Z1
  • 2Physics Department, British Columbia Institute of Technology, 3700 Willingdon Avenue, Burnaby, British Columbia, Canada V5G 3H2

  • *madison@phas.ubc.ca

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Vol. 84, Iss. 2 — August 2011

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