X-ray-spectroscopy analysis of electron-cyclotron-resonance ion-source plasmas

J. P. Santos, A. M. Costa, J. P. Marques, M. C. Martins, P. Indelicato, and F. Parente
Phys. Rev. A 82, 062516 – Published 23 December 2010

Abstract

Analysis of x-ray spectra emitted by highly charged ions in an electron-cyclotron-resonance ion source (ECRIS) may be used as a tool to estimate the charge-state distribution (CSD) in the source plasma. For that purpose, knowledge of the electron energy distribution in the plasma, as well as the most important processes leading to the creation and de-excitation of ionic excited states are needed. In this work we present a method to estimate the ion CSD in an ECRIS through the analysis of the x-ray spectra emitted by the plasma. The method is applied to the analysis of a sulfur ECRIS plasma.

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  • Received 20 August 2010

DOI:https://doi.org/10.1103/PhysRevA.82.062516

© 2010 The American Physical Society

Authors & Affiliations

J. P. Santos1, A. M. Costa2, J. P. Marques2, M. C. Martins1, P. Indelicato3, and F. Parente1

  • 1Centro de Física Atómica, CFA, Departamento de Física, Faculdade de Ciências e Tecnologia, FCT, Universidade Nova de Lisboa, P-2829-516 Caparica, Portugal
  • 2Centro de Física Atómica, CFA, Departamento de Física, Faculdade de Ciências, FCUL, Universidade de Lisboa, Campo Grande, P-1749-016 Lisboa, Portugal
  • 3Laboratoire Kastler Brossel, École Normale Supérieure, CNRS, Université P. et M. Curie – Paris 6, Case 74; 4, place Jussieu, F-75252 Paris CEDEX 05, France

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Issue

Vol. 82, Iss. 6 — December 2010

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