Probing photoelectron multiple interferences via Fourier spectroscopy in energetic photoionization of Xe@C60

Andrea Potter, Matthew A. McCune, Ruma De, Mohamed E. Madjet, and Himadri S. Chakraborty
Phys. Rev. A 82, 033201 – Published 17 September 2010

Abstract

Considering the photoionization of the Xe@C60 endohedral compound, we study in detail the ionization cross sections of various levels of the system at energies higher than the plasmon resonance region. Five classes of single-electron levels are identified depending on their spectral character. Each class engenders distinct oscillations in the cross section, emerging from the interference between active ionization modes specific to that class. Analysis of the cross sections based on their Fourier transforms unravels oscillation frequencies that carry unique fingerprints of the emitting level.

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  • Received 2 August 2010

DOI:https://doi.org/10.1103/PhysRevA.82.033201

©2010 American Physical Society

Authors & Affiliations

Andrea Potter1, Matthew A. McCune1, Ruma De1, Mohamed E. Madjet2, and Himadri S. Chakraborty1,*

  • 1Center for Innovation and Entrepreneurship, Department of Chemistry and Physics, Northwest Missouri State University, Maryville, Missouri 64468, USA
  • 2Institute of Chemistry and Biochemistry, Free University, Fabeckstrasse 36a, D-14195 Berlin, Germany

  • *himadri@nwmissouri.edu

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Vol. 82, Iss. 3 — September 2010

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