Abstract
High-resolution x-ray spectra induced by 2 MeV protons in thick Ti, TiO, , , , , TiC, TiN, and targets were measured using a wavelength dispersive spectrometer combined with a position-sensitive detector. The intensities and energies of the and lines relative to the line were extracted. The influence of self-absorption in thick targets was investigated using related x-ray-absorption near-edge-structure spectra that are available in the literature to extract mass absorption coefficients close to the absorption edge. The correlation of the relative position of the line with a titanium formal oxidation state in oxide compounds confirmed that the oxidation state of Ti in is probably a mixture of Ti III and Ti IV states, which has been recently reported by other authors using different methods. The strengths of the and transition probabilities per titanium-ligand pair were found to decrease exponentially as the average titanium-ligand bond distance increased, which is similar to results obtained for various compounds with vanadium or manganese as the central metal atoms.
3 More- Received 1 June 2009
DOI:https://doi.org/10.1103/PhysRevA.80.042519
©2009 American Physical Society